Tue. Apr 21st, 2026

Laser Radar for High Speed Non Contact Measurement 

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In high speed production, measurement often becomes the bottleneck, a new system aims to deliver faster, consistent inspection without interrupting workflows.

Nikon releases the new APDIS MV5X Laser Radar
Nikon releases the new APDIS MV5X Laser Radar

Nikon Corporation has introduced the APDIS MV5X laser radar system, extending its non contact metrology lineup with a focus on speed, portability, and deployment flexibility across manufacturing environments.

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The APDIS MV5X is engineered to address a growing requirement in advanced manufacturing where inspection must keep pace with automated production lines. Compared to earlier models, the system delivers up to six times faster scan speeds, enabling rapid measurement of complex features without compromising accuracy. This directly contributes to reduced inspection cycle times and lower production downtime, particularly in high throughput sectors such as automotive and aerospace manufacturing.

From a hardware standpoint, the system adopts a compact and lightweight design, weighing under 12 kg. This allows it to function both as a portable metrology tool and as an integrated component within automated setups. The form factor supports mounting on robotic arms and automated guided vehicles, aligning with the shift toward flexible and reconfigurable production systems.

A key operational advantage lies in its ability to maintain consistent measurement performance across different environments. The same system can be deployed seamlessly from controlled measurement labs to active production lines, ensuring uniform measurement conditions and preserving data continuity. This consistency is increasingly important for closed loop quality systems and digital manufacturing workflows where traceability and repeatability are critical.

The system is built on Nikon’s optical engineering foundation, incorporating high performance NIKKOR lenses alongside over 25 years of laser radar development. This combination enables reliable non contact measurement, especially in applications where contact based inspection methods are either impractical or risk damaging sensitive surfaces.

By combining higher scan speeds, mobility, and consistent performance across environments, the APDIS MV5X reflects a broader shift toward inline, automated metrology designed to scale with modern manufacturing demands.

Click here for the official announcement.

By uttu

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